spectroscopic ellipsometry – TechConnect Briefs

Optical characterizations of multi-shape nanoparticles in polymer thin film layers

Carlberg M., Pourcin F., Margeat O., Le Rouzo J., Berginc G., Sauvage R.-M., Ackermann J., Escoubas L., Aix Marseille University, FR

Metallic nanoparticles are currently a hot topic thanks to their tuneable optical properties. Indeed, their light absorption or scattering is material, size and shape, but also environment dependent. We aim to take advantage of these [...]

A comparative study on sensitivity for biomolecular detection between gold nanoparticles coated and uncoated gold thin film using spectroscopic ellipsometry

Moirangthem R.S., Chang Y-C, Hsu S.-H., Wei P.-K., Research Center for Applied Sciences, TW

We investigate the plasmonic responses of gold nanoparticles (AuNP) coated and uncoated on 30nm gold thin film with aqueous medium having different refractive index using SPR ellipsometry. (See Figure 1) The sensitivities in both cases [...]

Optical properties of 2D nanoparticle arrays

Portal S., Vallvé M.A., Arteaga O., Ignes-Mullol J., Bertran E., FEMAN group, ES

The self-assembly of nanometric size particles in large area compact monolayers has recently attracted considerable interest in terms of the fabrication of new optical nanostructured devices of macroscopic dimensions. These nanometric arranged surfaces present a [...]

New Developments in Spectroscopic Ellipsometry for Nano Sciences

Piel J.-P., Darragon A., Defranoux C., SOPRA-SA, FR

Spectroscopic Ellipsometry (SE) is an optical technique, non destructive, to characterize the complex reflectivity of surfaces and layers from the deep UV (190nm) to the mid InfraRed (20µ). SE does not need any reference surface [...]

Optical Properties of Silicon Nanocrystals Embedded in SiO2 Matrix

Ding L., Chen T.P., Liu Y., Nanyang Technological University, SG

In this work, spectroscopic ellipsometry (SE), which is a nondestructive method, is employed to determine the optical constants (refractive index and extinction coefficient) and thus the dielectric functions of the isolated nc-Si with a mean [...]