nanoscale – Page 2 – TechConnect Briefs

Residual Stress Measurements of High Spatial Resolution

Vogel D., Luczak F., Michel B., Fraunhofer Institute for Reliability and Microintegration, DE

Residual stresses in semiconductor and MEMS devices superposing functional and environmental loading are one of the crucial reliability issues as they can add significant stress levels leading finally to component damage. Most of routinely used [...]

Accommodation of Characterization Tools

York L., Abbie Gregg, Inc., US

Characterization tools are the cornerstone to nanoscale research including microscopy (TEM, SEM, AFM and Aberration Corrected Electron Microscopy), spectroscopy/spectrometry (NMR, FTIR, Acoustic), and advanced nano mechanical (nano scale manipulations) tools. Characterization tools are highly sensitive [...]

Effective Use of Focused Ion Beam (FIB) in Investigating Fundamental Mechanical Properties of Metals at the Nano-Scale

Greer J.R., Nix W.D., Palo Alto Research Center, US

In this work, FIB is utilized in manufacturing of nano-pillars to investigate plasticity of metals at nano-scale. Gold nano-pillars were fabricated from bulk gold and epitaxial gold films on MgO substrates and subsequently compressed using [...]

Compact Modeling Framework for Short-Channel DG and GAA MOSFETs

Børli H., Kolberg S., Fjeldly T.A., Norwegian University of Science and Technology, NO

To achieve sufficient accuracy in the compact modeling of short-channel, nanoscale DG and GAA MOSFETs, the multi-dimensionality of the body potential and the electronic charge distribution has to be accurately described. In sub-threshold, the device [...]

Monte Carlo Algorithm for Nanoscale Electro-Thermal Optimization

Skorek A.W., Ble S.V., Anders G., Nazarko J., University of Quebec at Trois-Rivieres, CA

In this paper, we will present a Monte Carlo method based algorithm established for a sample nanoelectronics device. We are assuming that at the nanoscale level like at the highest the thermal phenomena are important [...]

The Nucleolus and Cellular Stress: Analysis by Coherent Phase Microscopy

Tychinsky V.P., Kretyshev A.V., Klemyashov I.V., Reshetov I.V., Vyshenskaya T.V., Shtil A.A., P.A.Hertsen Moscow Research Oncological Institute, RU

Coherent phase microscopy is a nanoscale measurement technique, an original method of monitoring the responses to cellular stress. We demonstrate that: 1) optically dense subcellular structures, including the nuclei and nucleoli, can be clearly detected [...]

The Relationship Between Nanoscale AFM Adhesive Force Measurements using Calcite Crystals with Macroscale contact angle and Scaling Characteristics

Boyd R.D., Bargir S., Dunn S., Jefferson B., Cranfield University, UK

The growth of scale, which primarily consists of calcite crystals, is a major problem in water systems. AFM probes have been modified with calcite crystal in order to measure the strength of adhesion between the [...]

Keywords: nanoscale