Direct Observation of Nanofabrication using the Optical Microscope combined with Nanopipette/QTF-AFM System
An S., Stambaugh C., Kwon S., Lee K., Kim B., Kim Q., Kim B., Kim Q., Jhe W., Seoul National University, KR
We demonstrated direct observation of nanofabrication using the optical microscope (OM) combined with nanopipette/QTF-AFM (Quartz Tuning Fork-Atomic Force Microscopy) system. Various solutions are ejected onto the substrate through the nano-/micro-aperture of the pulled pipette, and [...]