flicker noise – TechConnect Briefs

1/f Noise Modeling at Low Temperature with the EKV3 Compact Model

Martin P., Ghibaudo G., CEA/LETI/MINATEC, FR

Advanced compact models are mandatory for simulation of mixed analog-digital circuits working at low temperature (77-200 K). In this work, the 1/f noise model introduced in the EKV3 model is evaluated. This evaluation is performed [...]

Modeling of FET Flicker Noise and Impact of Technology Scaling

Chen C-Y, Liu Y., Cao S., Dutton R., Sato-Iwanaga J., Inoue A., Sorada H., Stanford University, US

Ongoing scaling of device dimensions, including the introduction of new channel materials and device structures, as well as the incorporation of novel gate-stack materials, has major implications on noise performance metrics. In particular, flicker noise [...]