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HomeKeywordsDiffraction

Keywords: Diffraction

Controlling light diffraction with nanostructures

Tufaile A., Tufaile A.P.B., Vanderelli T.A., Snyder M., Tufaile A., Tufaile A.P.B., University of Sao Paulo, BR
We are presenting the main results of our research using smart fluids to control the light scattering using some devices based on nanotechnology. We are presenting the Ferrolens or Ferrocell®, which consists of a Hele-Shaw [...]

A Programmable Transmission Electron Detector for Nanomaterials Characterization in a Scanning Electron Microscope

Holm J., Caplins B., Keller R., National Institute of Standards and Technology, US
A new programmable detector for scanning transmission electron microscopy (p-STEM) is described. A digital micromirror array lies at the heart of the detector and serves as a programmable virtual objective aperture. Two sensors, a photomultiplier [...]

Inkjet Printing of High Index Zirconia Nanocomposite Materials

Healy M.D., Guschl P., Wang X., Weinstein M., Pixelligent Technologies LLC, US
Abstract High refractive index (RI) nanocomposites have properties which surpass traditional polymers while maintaining manufacturability. Nanocrystal-polymer nanocomposites, when inkjet-printed, are useful to many display components and aid the development of next generation displays. This paper [...]

High Capacity Nano-optical Diffraction Bar-code Tagging for Biological and Chemical Applications

Banu S., Birtwell S., Chen Y., Galitonov G., Morgan H., Zheludev N., University of Southampton, UK
Here we describe a new method for encoding small beads which allows for non-contact reading. The tagging technique is based on fabricating a nano-structured pattern on the surface of the particle, which is only a [...]

Analytic 3D Greens Function Approach to Scattering and Diffraction from Patterned and/or Imperfect Multilayers

Gallatin G.M., Bell Labs, Lucent Technologies, US
The 3D electromagnetic Greens function Gij(x,x) for planar multilayers is constructed from the eigenmodes of Maxwellís equations in the multilayer structure. Other approaches hav been used to derive the Greens function and the derivation here [...]

Modeling Image Formation in Layered Structures: Application to X-ray Lithography

Bollepalli S.B., Khan M., Cerrina F., UW-Madison, US
In the fabrication of semiconductor devices using lithography, the modeling of the exposure process is very often needed. The elements of a typical exposure system from a modeling perspective comprise of a radiation source, a [...]

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