characterization – Page 8 – TechConnect Briefs

Room-Temperature Synthesis and Characterization of Highly Monodisperse Transition Metal-Doped ZnO Nanocrystals

Singh S.P., Perales-Perez O., Tomar M.S., Parra-Palomino A., Ruiz-Mendoza A., University of Puerto Rico, PR

We present here the results of our current efforts on size-controlled synthesis of bare and Mn- and Co-doped ZnO nanocrystals. Stable suspensions of these materials were produced in ethanol solutions at room-temperature. XRD characterization of [...]

Biomolecular Patterning via Photocatalytic Lithography

Bearinger J.P., Hiddessen A.L., Wu K.J.J., Christian A.T., Dugan L.C., Stone G., Camarero J., Hinz A.K., Hubbell J.A., Lawrence Livermore National Laboratory, US

We have developed a novel method for patterning surface chemistry: Photocatalytic Lithography. This technique relies on inexpensive stamp materials and light; it does not necessitate mass transport or specified substrates, and the wavelength of light [...]

IBAD Nanothick Bioceramic Incorporation on Metallic Implants for Bone Healing Enhancement. From Physico/Chemical Characterization to In-vivo Performance Evaluation

Coelho P.G., Lemons J.E., University of Alabama at Birmingham, US

Preliminary data on in-vivo performance of nanothick bioceramic IBAD-coated metallic implants showed an increase in both osteoblastic activity and mechanical properties for bone surrounding these implants. The purpose of this study was to characterize a [...]

Molecular Dynamics of Biomimetic Ionomers Studied by Dielectric Spectroscopy on the Nanometer Length Scale

Welch K., Nederberg F., Bowden T., Strømme M., Uppsala University, SE

New biomimetic materials are being developed which show great promise for biotechnological applications. An understanding of the dynamic molecular processes in these materials at the nanoscale level is of particular interest and we show that [...]

Local Electrode Atom Probes for 3-D Metrology

Kelly T., Gribb T., Olson J., Martens R., Shepard J., Wiener S., Kunicki T., Ulfig R., Lenz D., Strennen E., Oltman E., Bunton J., Strait D., Imago Scientific Instruments Corp., US

Imago Scientific Instruments is developing its Local Electrode Atom Probe (LEAP) microscope for use in semiconductor, data storage, and other nanotechnology industries to provide 3-D atomic-scale metrology. The LEAP microscope achieves true 3-D atomic-scale analysis [...]

Device Characterization at the Wafer Level via Optical Actuation and Detection

Hedley J., Burdess J.S., Harris A.J., Gallacher B.J., Newcastle University, UK

This paper investigates the technique of optical actuation of MEMS. It is shown that a device can be driven into all of its vibrational modes simply and non-destructively by a laser pulse, making this an [...]

An Automatic Macro Program developed for Characterization, Parameter Extraction and Statistic Analysis of Spiral Inductors

Huang G.W., Chiu D.Y., Chen K.M., National Nano Device Laboratories, TW

In the paper, a macro program based on Agilent IC-CAP software is developed for characterization, parameter extraction and statistic analysis of on chip spiral inductors. All procedures can be finished very easily in few buttons [...]