AFM – Page 6 – TechConnect Briefs

Templated virus deposition: from molecular-scale force measurements to kinetic Monte Carlo simulations

Elhadj S., Gilmer G.H., Friddle R.W., Estrada M., Manchester M.E., Johnson J.E., De Yoreo J.J., Noy A., Lawrence Livermore National Laboratory, US

The use of macromolecular scaffolds for hierarchical organization of molecules and materials is a common strategy in living systems that leads to emergent behavior. One characteristic of this strategy is that it generates micron-scale structures [...]

Towards Automation in the Characterization of Nanostructured Materials and Devices

Weishaupt K., Schmidt U., Dieing T., Hollricher O., WITec GmbH, DE

The characterization of nanostructured materials implies knowledge about their chemical and structural properties, leading to a growing demand for characterization methods for heterogeneous materials on the nanometer scale. However, certain properties are difficult to study [...]

Characterization of Activated Carbon particles for nanocomposite synthesis

Terrazas-Bandala L.P., Zaragoza-Contreras E.A., González-Sánchez G., Ballinas-Casarrubias M.L., Advanced Materials Research Center (CIMAV), MX

Activated carbon from inexpensive sources has been of great interest for separation systems, efforts had been made to produce AC nanoparticles by different means, in the aim to integrate them to composite materials to enhance [...]

Characterisation of Electrical Fields of Buried Interdigitated Nanoscale Ti-Electrode Arrays by a Novel Atomic Force Microscopy Measurement Procedure and Their Fabrication by FIB Milling

Jenke M.G., Santschi Ch., Hoffmann P., EPFL (Ecole Polytechnique Fédérale de Lausanne), CH

The fabrication and characterisation of interdigitated titanium nanoelectrode arrays with 500nm and 50nm width and spacing is described in this work. The electrical-field above the fabricated 500nm electrodes can be sensed by means of a [...]

Confocal Raman AFM, a powerful tool for the nondestructive characterization of heterogeneous materials

Schmidt U., Vargas F., Kress M., Dieing T., Weishaupt K., Hollricher O., WITec GmbH, DE

The Confocal Raman-AFM is a breakthrough in microscopy. It combines three measuring techniques in one instrument: a high resolution confocal optical microscope, an extremely sensitive Raman spectroscopy system, and an Atomic Force Microscope (AFM). Using [...]

Highly sensitive Scanning Capacitance Microscope

Tanbakuchi H., Agilent Technologies, US

Summary—Emerging nanotechnology and biotechnology are in direct need of metrology tools with better than 10 –nm spatial resolution that are capable of imaging surfaces and nanoembeded structures. Scanning local probe microscopy (SLPM) techniques have advanced [...]

Identifying Nanoscale Molecular Binding Events With SPM/AFM

Johnson W.T., Agilent Technologies, US

PicoTRECTM is a chemical/biological detection accessory for the Agilent SPM/AFM (scanning probe microscopy/atomic force microscopy) that combines molecular scale imaging with nanoscale, molecular recognition mapping. It is being used to map interactions between antibodies/antigens and [...]

Keywords: AFM