Nitrogen-doped titania films were grown by magnetron sputtering. XPS analysis was used to identify the nitrogen content and the oxygen stoichiometry of the samples. XANES evidenced an increase of the Ti 3d charge density. XRD analysis evidenced mainly rutile phases, with traces of anatase. EXAFS spectroscopy identified a further nanostructured phase, which seems to be the main responsible for lowering the bandgap to around 3 eV and for increased photocatalytic efficiency of the films, as evidenced by UV-Vis. spectroscopy. AFM revealed that the films roughness is reduced.
Journal: TechConnect Briefs
Volume: 1, Technical Proceedings of the 2007 NSTI Nanotechnology Conference and Trade Show, Volume 1
Published: May 20, 2007
Pages: 364 - 367
Industry sector: Advanced Materials & Manufacturing
Topics: Advanced Materials for Engineering Applications