PKU HKUST Shenzhen Institution of IER.

Compact Modeling of Signal Transients and Integrity Analysis for Dispersionless Interconnect

Zhao W., PKU HKUST Shenzhen Institution of IER., CN

In this paper, a compact model for transient response of the dispersionless interconnects is rigorously derived with resistive, inductive and capacitive load terminations. The proposed compact models are verified by the HSPICE simulation result to [...]

FinFET reliability issue analysis by forward gated-diode method

Liu Z., PKU HKUST Shenzhen Institution of IER., CN

The reliability issue of the FinFET device is studied in details in this paper by the forward gated-diode R-G current method. Extraction of the stress induced interface states and oxide traps of FINFET is performed [...]