Nanoelectronics – Page 18 – TechConnect Briefs

A nanoscale machine shop for NWs

Cheng G.J., Li Ji, Purdue University, US

One-dimensional nanomaterials have attracted a great deal of research interest in the past few decades due to their unique mechanical, electrical and optical properties. Changing the shape of nanowires (NWs) is both challenging and crucial [...]

All polymer, injection molded nanoslits, fabricated through two-level UV-LIGA processes

Østergaard P.F., Mateucci M., Marie R., Kristensen A., Taboryski R., Technical University of Denmark, DK

Micro- and nanofluidic systems fabricated in silicon and glass substrates are expensive and have long production cycles. To minimize the time used by researchers to fabricate their systems, rather than using them, medium to high [...]

Directed Self Assembly: a Novel, High Speed Method of Nanocoating Ultra-thin Films and Monolayers of Particles

Powch G.A., Jain A.R., VersuFLEX Technologies LLC, US

A novel, practical fluidic method is presented for coating ultra-thin, ultra-uniform layers and realizing self-assembled monolayers of particles, into nanoscale in atmosphere and room temperature at rates scalable to web processes at >4 m/min. A [...]

A Pressure Controlled Pinched Flow Fractionation Device for Continuous Particle Separation

Trosborg J., Christiansen T.L., Technical University of Denmark, DK

A demonstration of a pinched flow fractionation device that enables pressure controlled tuning of the separation range of particles. This makes the device ready for easy and cheap mass-production, maintaining great flexibility, and rendering the [...]

Towards nanofabrication with UV femtosecond fiber laser

Huang H., PolarOnyx, Inc., US

In this paper, a UV fs fiber laser was used for direct writing nanofabrication on different materials. The laser used is a commercialized mode-locked fiber laser (PolarOnyx Uranus Series), generating typically Gaussian shape pulses (750 [...]

Milling Process Control with Dimensional Feedback on a Focused Ion Beam – Scanning Electron Microscope System (FIB-SEM)

Sanabia J.E., Raith USA, Inc., US

In nanofabrication and nanoanalysis, focused ion beam – scanning electron microscope (FIB-SEM) systems are increasingly used for demanding patterning tasks which rely on precise pattern placement and/or dimension control. Easily verifying and correcting for patterning [...]

Design and Fabrication of a Large Scale Electric Field Array Device for Directed Self-Assembly of Multilayer BioDerivatized Nanoparticle Materials

Heller M.J., Song Y., University of California San Diego, US

In earlier work, an electronic microarray device was used to carry out a bottom-up approach for the directed self-assembly of higher order 3D structures from biotin/streptavidin, DNA and enzyme derivatized nanoparticles. Structures with up to [...]

NanoFab: Manufacturing & Instrumentation

MIM Capacitors with stacked dielectrics

Gopalakrishnan H., Kailath B.J., Indian Institute of Information Technology Design and Manufacturing, Kancheepuram, IN

In this work, the characteristics of MIM capacitors with stacked dielectrics are being compared with that with single dielectrics. (100) p-type silicon wafers with resistivity in the range 0.1-0.2 Ωcm have been used as substrate. [...]

A model to describe the hump-like feature observed in the accumulation branch of CV-characteristics of MOS capacitors with oxide-hosted Si nanoparticles

Stuchinsky V.A., Kamaev G.N., Efremov M.D., Arzhannikova S.A., Institute of Semiconductor Physics, RU

A simple model is presented to clarify the formation of a hump-like feature observed in the accumulation branch of CV-characteristics of MOS capacitors with oxide-hosted Si nanoparticles.