Advanced Materials & Manufacturing – Page 567

Evaluation of Manipulation Probes for Expanding the Range of Capillary Force

Obata K.J., Saito S., Takahashi K., Tokyo Institute of Technology, JP

It is difficult to manipulate a micro-sized object precisely with conventional tools, because the gravity effect becomes extremely small compared to the adhesional one. Therefore, in order to perform reliable micromanipulation, we need to use [...]

A Micromanipulation Method based on the Capillary Force by Phase Transition

Katsuda O., Saito S., Takahashi K., Tokyo Institute of Technology, JP

The size of an object has decreased in the electrical and mechanical engineering field for fabricating highly functional microelectro-mechanical systems and photonic crystals. In micromanipulation, even if we can pickup micro-objects, it is very difficult [...]

Layer-by-layer Nano-assembled Polypyrrole Humidity Sensor

Nohria R., Khillan R.K., Su Y., Lvov Y., Varahramyan K., Louisiana Tech University, US

In recent years the influence of humidity has been given top priority in moisture sensitive areas such as high voltage engineering systems, storage areas, computer rooms etc. Conducting or semiconducting conjugated polymers show significant change [...]

Bio-assembly of Nanoparticles for Device Applications

Singh K.V., Alim K., Wang X., Balandin A., Ozkan C.S., Ozkan M., Ozkan C.S., Ozkan M., UC-Riverside, US

Due to limitations of current lithographic methods, for future electronic device fabrication especially below 10 nm various methods are currently being investigated. To this end, in my research group, we assemble nanometer size particles with [...]

NEMS Mass Sensor by Focused Ion Beam Fabrication

Boonliang B., Prewett P.D., Ward M.C.L., Docker P.T., Birmingham University, UK

Due to rising industrial demands (food, biology, control), there is a drive to develop smaller, more sensitive sensor-devices with real-time capability. The objective of this work is to utilise Focused Ion Beam (FIB) fabrication technology [...]

Reflow Microfabrication for Refractive Optical Components: Process and Materials

Johnstone R.W., Parameswaran M., Simon Fraser University, CA

Our paper will describe a new method of fabricating refractive optical components for free-space micro-optical systems. The seminal paper on this topic was Pister et al [1], in which hinges were used to demonstrate several [...]

Micro and Nano Structuring and Assembly

In-situ Study of SAMs Growth Process by Cross Analysis of AFM Height and Lateral Deflection

Wu C-L, Tseng F-G, Chieng C-C, National Tsing Hua University, TW

We set a model for analysis the AFM image, by cross analysis multiple channel, we can investigate more nano scale information on surafce property.

Surface Reactions of Linear Atomic Metal Wire Complexes

Lung C-H, Chang C-C, National Taiwan University, TW

The communication among nanostructures and between these structures and the outside world becomes very critical as the key features in electronics devices continue to shrink in the double-digit nanometer regime. To explore the possible formation [...]

Nanocharacterization Using Secondary Ion Mass Spectrometry (SIMS)

Novak S.W., Magee C.W., Evans East - Evans Analytical Group, US

Secondary Ion Mass Spectrometry (SIMS) has been widely applied for depth profile analysis in the semiconductor industry, but less widely applied to characterization of other materials. Evans East has developed techniques over the last few [...]