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HomeSectorsAdvanced Materials & Manufacturing

Sector: Advanced Materials & Manufacturing

A Novel Method for Measuring the Sizes and Concentrations of 5-500 nm Particles in Colloidal Suspensions

Van Schooneveld H.G., Litchy M.R., Grant D.G., CT Associates, Inc, US
A new measurement technique has been developed that allows for measurement of particles as small as 5 nanometers in colloidal suspensions. The technique has demonstrated the ability to provide unique and useful particle size distribution [...]

Passive Microrheology : Non Contact Measurement of Viscoelastic Properties of Biopolymers

Tisserand C., Kotzev A., Fleury M., Brunel L., Bru P., Brunel L., Meunier G., Formulaction, FR
This work presents a new technique of the passive microrheology for the study of the microstructure properties of soft materials. Our technology uses Multi Speckle DWS (MS-DWS) set-up in backscattering with a video camera. It [...]

Passive Microrheology : Non Intrusive Measurement of the Emulsions Stability

Tisserand C., Fleury M., Brunel L., Bru P., Brunel L., Meunier G., Formulaction, FR
This work presents a new technique of the passive microrheology for the study of the microstructure properties of soft materials like emulsions. Our technology uses Multi Speckle DWS (MS-DWS) set-up in backscattering with a video [...]

Nano-mapping Material Interfaces via Hot Electrons

Goh K.E.J., Troadec C., Institute of Materials Research and Engineering, SG
As devices shrink below 100 nm in size, nanoscale imperfections (due to defects and doping) at material interfaces become significant perturbations to ideal device characteristics and in some cases can dominate the device behavior. Of [...]

Laser Postionization Secondary Neutral Mass Spectrometry for Analysis on the Nanometer-Scale – the Followup

Veryovkin I.V., Baryshev S.V., Zinovev A.V., Tripa C.E., Peng Q., Elam J.W., Pellin M.J., Argonne National Laboratory, US
Depth resolution on the order of a few atomic layers has been demonstrated by initial tests of the dual beam sputter depth profiling with the SARISA laser post-ionization secondary neutral mass spectrometry instrument, which was [...]

Mechanical properties of PECVD Si3N4 thin films with rapid thermal annealing using finite element simulation

Chiang C-Y, Huang Z-K, Chen K.-S., National Cheng Kung University, TW
The entire study includes Si3N4 specimen fabrication, material and mechanical characterization, a new physical model derivation, as well as the corresponding finite element analysis (FEA) and simulations. Nevertheless, the standard method used for nanoindentation were [...]

Synthesis of Polypyrrole within Polymeric Nanotemplates in Aqueous Environment

Li X., Maladier-Jugroot C., Royal Military College of Canada, CA
cations (1-2). Polypyrrole is one of the most studied conducting polymers due to its good electrical conductivity, environmental stability and relatively easy synthesis (3-6). Earlier we reported an innovative way of synthesizing polypyrrole within nanotemplates [...]

Dispersing carbon nanotubes in polymer nanocomposites: detecting individually dispersed tubes

Tishkova V., Bonnet G., Puechmont P., Flahaut E., Bacsa W.S., CEMES, Univ. Toulouse, FR
Carbon nanotubes (CNTs) are used to make polymer composites conductive. Small amounts of CNTs (0.1-1 wt%) increase the conductivity by several orders of magnitude. The electrical percolation threshold depends strongly on the dispersion state of [...]

Using proton NMR to characterize functionalized single-walled carbon nanotubes

Nelson D.J., University of Oklahoma, US
Single-walled carbon nanotubes (SWCNTs) can be functionalized covalently at SWCNT ends, covalently at SWCNT sidewalls, or by complexation with SWCNT sidewalls. Each type of product has a wide range of applications, but sometimes the full [...]

Single Particle Resolution Zeta Potential Technique

Griffiths D., Bernt W., Hole P., Sullivan J., Malloy A., Carr B., NanoSight USA, US
A novel addition to a technique for the analysis of nanoparticles in a suspension is described. The Nanoparticle Tracking Analysis (NTA) technique visualizes then sizes individual nanoparticles, based on their Brownian motion. Unlike classical light [...]

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