Rondinone A., Iberi V., Matola B., Linn A., Joy D.
Oak Ridge National Laboratory, US
Keywords: graphene, helium ion microscopy, maskless lithography
Here we will discuss the utility of scanning helium ion lithography for fabricating conducting graphene structures that are supported directly by silicon oxide. The lithography is performed in a single step, dry, using high-resolution He- and Ne-ion milling directly on the supported graphene. These structures can have feature sizes ranging from multiple micrometers to less than 20 nanometers, and the graphene structures retain the ability to conduct electrons efficiently. Further we demonstrate that ion beams, due to their positive charging nature, may be used in conjunction with the graphene work function and secondary electron yield to observe the conductivity of graphene-based nanoelectronic devices in situ.
Journal: TechConnect Briefs
Volume: 1, Advanced Materials: TechConnect Briefs 2015
Published: June 14, 2015
Pages: 155 - 157
Industry sector: Advanced Materials & Manufacturing
Topics: Carbon Nano Structures & Devices, Graphene & 2D-Materials
ISBN: 978-1-4987-4727-1