Liu Y., Cao S., Oh T.Y., Wu B., Tornblad O., Dutton R.W.
Stanford University, US
Keywords: impedence field, noise, nonlinear distortion, RF, TCAD
This paper uses advanced TCAD tools—both IMF-based noise modeling and HB-based distortion modeling—to extract parameters of key importance in developing compact models. Additionally, the TCAD-based modeling provides insight into technology constraints that can potentially influence future MOS scaling for analog applications.
Journal: TechConnect Briefs
Volume: 3, Technical Proceedings of the 2006 NSTI Nanotechnology Conference and Trade Show, Volume 3
Published: May 7, 2006
Pages: 708 - 713
Industry sector: Sensors, MEMS, Electronics
Topic: Compact Modeling