Determination of micro-structural properties with x-ray absorption fine structure

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We studied the structural properties of ZnO nanostructures with x-ray absorption fine structure (XAFS) to understand the growth mechanism of vertically aligned ZnO nanorods of the average diameter of 50 – 150 nm. The orientation-dependent XAFS measurements parallel and perpendicular to the c-axis of ZnO nanorods with lengths of 0.1, 0.2 and 1.0 microns showed different amount of disorder existing in the bond lengths. The disorder in ab-plane was greatly reduced, as the ZnO formed into nanorods. We also demonstrate that the lateral surface of the ZnO nanorods have oxygen-termination determined by the XAFS analysis.

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Journal: TechConnect Briefs
Volume: 4, Technical Proceedings of the 2007 NSTI Nanotechnology Conference and Trade Show, Volume 4
Published: May 20, 2007
Pages: 9 - 12
Industry sector: Advanced Materials & Manufacturing
Topics: Materials Characterization & Imaging
ISBN: 1-4200-6376-6