Kulkarni J.S., Daly B., Ziegler K.J., Crowley T., Erts D., Polyakov B., Morris M.A., Holmes J.D.
University College Cork, IE
Keywords: anodized aluminium oxide, conductive atomic force microscopy, mesoporous silicas, nanowires, thin films
We have prepared high-density, ordered arrays of semiconductor nanowires within the pores of mesoporous thin films (MTFs) and anodized aluminum oxide (AAO) matrices using a supercritical fluid solution-phase inclusion technique. Conductive atomic force microscopy (C-AFM) was utilized to study the electrical properties of the nanowires within these arrays. Nearly all of the semiconductor nanowires contained within the AAO substrates were found to possess similar electrical properties demonstrating that the nanowires are continuous and reproducible within each pore.
Journal: TechConnect Briefs
Volume: 2, Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 2
Published: May 8, 2005
Pages: 627 - 629
Industry sector: Advanced Materials & Manufacturing
Topic: Nanoparticle Synthesis & Applications
ISBN: 0-9767985-1-4