Compact Modeling of Avalanche Breakdown in pn-Junctions for Computer-Aided ESD Design (CAD for ESD)

Subramanian Y., Darling R.B.
University of Washington, US

Keywords: avalanche, breakdown, CAD, ESD, pn junction

This paper presents and validates compact, physically-based electrothermal models of the avalanche process in pn junctions for use in network simulators (e.g. Saber). Self-heating effects are also included. This enables the simulation of large systems of interconnected ESD structures, permitting a ‘CAD-for-ESD’ approach in commercial ESD design.

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Journal: TechConnect Briefs
Volume: 1, Technical Proceedings of the 2001 International Conference on Modeling and Simulation of Microsystems
Published: March 19, 2001
Pages: 48 - 51
Industry sector: Sensors, MEMS, Electronics
Topic: Compact Modeling
ISBN: 0-9708275-0-4