Sahoo D.R., Sebastian A., Salapaka M.V.
Iowa State University, US
Keywords: atomic force microscopy, hypothesis testing, state observer, state-space model
In typical dynamic mode operation of atomic force microscopes steady state signals like amplitude and phase are used for detection and imaging of material. In these methods, high quality factor of the cantilever results in high resolution, but low bandwidth and vice versa. In this paper we present a methodology that exploits the deflection signal during the transients of the cantilever motion. The principle overcomes the fundamental limitations on the trade off between resolution and bandwidth present in existing methods and makes it independent of the quality factor. Experimental results provided corroborate the theoretical development.
Journal: TechConnect Briefs
Volume: 3, Technical Proceedings of the 2004 NSTI Nanotechnology Conference and Trade Show, Volume 3
Published: March 7, 2004
Pages: 11 - 14
Industry sectors: Advanced Materials & Manufacturing | Sensors, MEMS, Electronics
Topic: Photonic Materials & Devices
ISBN: 0-9728422-9-2