Boltryk P.J., Harris C.J., White N.M.
University of Southampton, UK
Keywords: condition monitoring, fault detection, intelligent sensor, kernel, support vector machine
This paper describes current research into the development of an intelligent sensor architecture, where signal conditioning is performed onboard the sensor itself, in software. Our proposed architecture for an intelligent sensor uses data-based models of the sensor for signal conditioning and fault detection, so that the sensor is robust to sensor degradation and its processed output includes an estimate of uncertainty with each measurement value for higher level sensor management processes such as data fusion. We use a data-based kernel representation for the signal conditioning system, which avoids having to derive physical models of the sensor from first principles. A sparse realisation of the kernel model provides fast predictions and opportunities for efficient updating of the sensor model to enable reconfiguration of the sensor model based on incoming data. We show that these techniques have the ability to detect degradation in a MEMS sensor in real-time, using elevated temperatures in laboratory conditions.
Journal: TechConnect Briefs
Volume: 3, Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 3
Published: May 8, 2005
Pages: 403 - 406
Industry sector: Sensors, MEMS, Electronics
Topics: MEMS & NEMS Devices, Modeling & Applications, Sensors - Chemical, Physical & Bio
ISBN: 0-9767985-2-2