A Method for Determining the Dependence of Integrated Circuit Performance on Silicon Process, Device and Circuit Parameters

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The goal of this project is to develop a structured methodology for achieving a design of a block of circuit in an IC which is more compliant to the specification using a multiple simulation approach. This has been accomplished by developing a statistical design and simulation methodology. This methodology has been demonstrated by simulating a Bipolar Low Noise Amplifier (LNA) circuit using micro-level semiconductor device parameters and associated manufacturing process parameters for the circuit parameters of interest. The physics-based device and process models are then coupled with proprietary statistical simulation software (STADIUM”) to create a robust circuit design which gives rise to a more compliant product with higher yields.

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Journal: TechConnect Briefs
Volume: 1, Technical Proceedings of the 2001 International Conference on Modeling and Simulation of Microsystems
Published: March 19, 2001
Pages: 173 - 172
Industry sector: Sensors, MEMS, Electronics
Topic: Modeling & Simulation of Microsystems
ISBN: 0-9708275-0-4