ellipsometry – TechConnect Briefs

Fabrication and Opto-Electronic Modeling of Down-Shifting Enhanced Photovoltaics

Montes-Bojorquez J.R., Villa-Bracamonte M.F., Ayon A.A., University of Texas at San Antonio, US

We report the fabrication and spectroscopic ellipsometry characterization of layer-by-layer assembled quantum dot multilayered films and their influence in the power conversion efficiency of silicon solar cells. The experimental performance of the resulting structure that [...]

Optical Characterization of the Au Nanoparticle Monolayer on Silicon Wafer

Wang D-S, Chuang L., Lin C-W, National Taiwan University, TW

In recent years, self-assembly technique has been widely used in fabricating Au nanoparticle layer. It has drawn a lot of attentions owing to its promising application in biosensing.However, to date there have been very few [...]

Surface Characterization of a Direct, Label-Free Piezoelectric Immunosensor Platform

Papadopoulou-Bouraoui A., Lejeune M., Barrero-Moreno J., Valsesia A., Manso M., Gilliland D., Ceccone G., Rossi F., European Commission - JRC, IT

During this study the QCM (Quartz Crystal Microbalance) crystal surface was functionalized in order to provide active amino groups, and serve as an active platform for antibody immobilization and the development of direct, label-free immunosensors. [...]