SPM Investigation of the Electron Properties YSZ Nanostructured Films
Antonov D.A., Gorshkov O.N., Kasatkin A.P., Maximov G.A., Saveliev D.A., Filatov D.O., University of Nizhny Novgorod, RU
In present work, the electron properties of YSZ nanostructured films using combined Atomic Force Microscopy / Òunnel Spectroscopy (AFMTS) have been investigated.It was demonstrated, the implantation of the films ZrO2(Y) by zirconium ions reduced forming [...]