conductive atomic force microscopy

Electrical characterization with high spatial resolution of P3HT:PCBM blends used in organic photovoltaics by means of conductive atomic force microscopy

Omar Y.M., Chiesa M., Apostoleris H.N., Al Ghaferi A., Masdar Institute, AE

Conductive atomic force microscopy was used to characterize P3HT-PCBM blends in the nanoscale with high spatial resolution. Local spectroscopy scans were obtained and charge carrier mobility was determined.

Observation of Soft-Breakdown in Ultra-Thin SiO2 Films under Repetitive Ramped Voltage Stress by Using Conductive Atomic Force Microscopy

Wu Y-L, Lin S-T, Liao J-C, National Chi-Nan University, TW

The degradation and breakdown characteristics of ultra-thin SiO2 (Tox = 5 nm) were investigated by using conductive AFM (C-AFM). Repetitive ramped voltage stress (RVS) was applied through the C-AFM tip to the oxide with polarity [...]

Conductive Films of Ordered High-Density Nanowire Arrays

Kulkarni J.S., Daly B., Ziegler K.J., Crowley T., Erts D., Polyakov B., Morris M.A., Holmes J.D., University College Cork, IE

We have prepared high-density, ordered arrays of semiconductor nanowires within the pores of mesoporous thin films (MTFs) and anodized aluminum oxide (AAO) matrices using a supercritical fluid solution-phase inclusion technique. Conductive atomic force microscopy (C-AFM) [...]