Conductive atomic force microscopy was used to characterize P3HT-PCBM blends in the nanoscale with high spatial resolution. Local spectroscopy scans were obtained and charge carrier mobility was determined.
Journal: TechConnect Briefs
Volume: 3, Nanotechnology 2014: Electronics, Manufacturing, Environment, Energy & Water
Published: June 15, 2014
Pages: 352 - 355
Industry sector: Energy & Sustainability
Topics: Solar Technologies