Electrical characterization with high spatial resolution of P3HT:PCBM blends used in organic photovoltaics by means of conductive atomic force microscopy

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Conductive atomic force microscopy was used to characterize P3HT-PCBM blends in the nanoscale with high spatial resolution. Local spectroscopy scans were obtained and charge carrier mobility was determined.

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Journal: TechConnect Briefs
Volume: 3, Nanotechnology 2014: Electronics, Manufacturing, Environment, Energy & Water
Published: June 15, 2014
Pages: 352 - 355
Industry sector: Energy & Sustainability
Topics: Solar Technologies
ISBN: 978-1-4822-5830-1