Stokes D.J. – TechConnect Briefs

Focused Ion Beam machining of large and complex nanopatterns

Wilhelmi O., Roussel L, Anzalone P., Stokes D.J., Faber P., Reyntjens S., FEI Company, NL

Modern FIB columns have not only reduced minimum spot sizes, but has also improved beam profiles at large and intermediate FIB currents. Focused ion beams with high beam currents and yet small spot sizes and [...]

The Impact of Advanced S/TEM on Atomic-Scale Characterisation and Analysis

Hubert D.H.W., Freitag B., Stokes D.J., FEI Company, NL

As the limits of nanotechnology are expanded ever further, so too must we push back the frontiers of imaging and analysis. The need for tools that can deliver new, ultra-high resolution information is driving the [...]

Characterisation of Native-State Soft Matter using ‘Multi-Mode’ Electron Microscopy

Stokes D.J., Baken E., Lich B.H., Hubert D.H.W., FEI Company, NL

Soft condensed matter and complex fluids are of increasing technological significance. It is therefore crucial that we extend the capabilities of conventional solid state imaging and analytical techniques to include the observation of materials such [...]

Advanced CryoTEM and Tomography for Two- and Three-Dimensional Nano-Characterisation of Soft Matter

Sourty E., de Haas F., Frederik P.M., Frederik P.M., Loos J., Stokes D.J., Hubert D.H.W., FEI Company, NL

Recent advances in transmission electron microscopy (TEM) mean that we are able to achieve unprecedented resolution at the atomic level. Furthermore, improved methods for obtaining and reconstructing tilt series projections allow us to create high [...]

New Characterisation Techniques for the Study of Nanoscale Polymeric Systems in Two- & Three-Dimensions

Stokes D.J., Reyntjens S., Jiao C., Hayles M.F., Hubert D.H.W., FEI Company, NL

Activity in the development of polymer-based materials, composites and devices is more intense than ever. At the same time, techniques and methods for their characterisation have become more powerful, giving new insights into the spatial [...]

High resolution Nanolithography using Focused Ion Beam Scanning Electron Microscopy (FIB SEM)

Wilhelmi O., Roussel L, Stokes D.J., Hubert D.H.W., FEI Company, NL

State-of-the-art FIB technology combined with high-performance SEM is making a big impact on nanotechnology, particularly with the ability to use either focused ions or electrons to perform advanced nanolithography. Achieving the highest standards requires an [...]