Saito Y. – TechConnect Briefs

Analysis of Lag Phenomena and Current Collapse in Field-Plate AlGaN/GaN HEMTs with High-k Passivation Layer

Komoto K., Saito Y., Horio K., Shibaura Institute of Technology, JP

In AlGaN/GaN HEMTs, slow current transients are often observed even if the gate voltage or the drain voltage is changed abruptly. This is called gate lag or drain lag, and problematic in circuits applications. The [...]

Analysis of Gate-Length Dependence of Lags and Current Collapse in Field-Plate AlGaN/GaN HEMTs

Chiba T., Saito Y., Tsurumaki R., Horio K., Shibaura Institute of Technology, JP

We make 2-D transient simulations of field-plate AlGaN/GaN HEMTs with a semi-insulating buffer layer, where a deep acceptor above the midgap is considered. We particularly study how the gate lag, drain lag and current collapse [...]

Reduction in Lags and Current Collapse in Field-Plate AlGaN/GaN HEMTs with High Acceptor Density in a Buffer Layer

Saito Y., Tsurumaki R., Noda N., Horio K., Shibaura Institute of Technology, JP

We make a two-dimensional transient analysis of field-plate AlGaN/GaN HEMTs with a semi-insulating buffer layer, where a deep acceptor above the midgap is considered. It is studied how the deep-acceptor density and the field plate [...]

Effect of furnace temperature on the nucleation behavior and configurations of carbon nanoparticles

Ono K., Watanabe A., Matsukawa Y., Saito Y., Aoki H., Aoki T., Fukuda O., Aoki H., Aoki T., Yamaguchi T., Tohoku University, JP

The objective of the present study is to examine the impact of nucleation behavior and particle size distribution on morphology of carbon black. We used a fixed sectional approach applying the detailed chemical kinetic reaction [...]