Si-Based Process Aware SPICE Models for Statistical Circuit Analysis
Cuthbertson A., Dasarapu V.K., Krishnamurthy S., Lin X-W, Mahotin Y., Mukherjee P., Roger F., Ryles R., Uppal S., Synopsys, Inc., US
This paper describes methodology for constructing compact SPICE models as a function of process parameter variations. The methodology involves global extraction of process-dependant SPICE model parametersfrom silicon data. The robustness of this methodology was tested [...]