Compact Modeling of Nonlinearities in Submicron MOSFETs
da Silva P.D., de Sousa F.R., Schneider M.C., Montoro C.G., Schneider M.C., Federal University of Santa Catarina, BR
Low power operation in RF CMOS circuits requiring low-distortion levels is often difficult to achieve due to the exponential relationship between drain current (IDS) and gate-to-source voltage (VGS) in subthreshold region. Our contribution in this work [...]