Hodkiewicz J. – TechConnect Briefs

Characterization of Microcrystalline and Amorphous Thin Film Silicon Devices with Raman Spectroscopy

Wall M., Hodkiewicz J., Thermo Fisher Scientific, US

Raman spectroscopy is highly sensitive to even slight changes in morphology of highly symmetrical, covalently bonded materials making it an ideal technique to characterize Silicon films. Furthermore, Raman spectroscopy is relatively insensitive to glass making [...]

Characterization of Microcrystalline and Amorphous Thin Film Silicon Devices with Raman Spectroscopy

Wall M., Hodkiewicz J., Thermo Fisher Scientific, US

Raman spectroscopy is highly sensitive to even slight changes in morphology of highly symmetrical, covalently bonded materials making it an ideal technique to characterize Silicon films. Furthermore, Raman spectroscopy is relatively insensitive to glass making [...]

Rapid Determination of Purity of Carbon Nanotubes

Wall M., Hodkiewicz J., Thermo Fisher Scientific, US

Raman spectroscopy can provide for quick measurements of the carbonaceous purity of carbon nanotube samples. Carbonaceous purity is a critical parameter for many applications of carbon nanotubes. Raman spectroscopy has been reported many times in [...]

Introduction to Raman Spectroscopy as a Characterization Tool for Carbon Nanotubes, Graphene, and other Carbon Nanostructures

Wall M., Hodkiewicz J., Thermo Fisher Scientific, US

While there have been many publications produced in which Raman spectroscopy has been used to characterize various aspects of carbon nanostructures, there have been few works published which provide an overview of what the technique [...]

Characterization of Microcrystalline and Amorphous Thin Film Silicon Devices with Raman Spectroscopy

Hodkiewicz J., Wall M., Thermo Fisher Scientific, US

Raman spectroscopy is highly sensitive to even slight changes in morphology of highly symmetrical, covalently bonded materials making it an ideal technique to characterize Silicon films. Furthermore, Raman spectroscopy is relatively insensitive to glass making [...]

Characterization of Microcrystalline and Amorphous Thin Film Silicon Devices with Raman Spectroscopy

Hodkiewicz J., Wall M., Thermo Fisher Scientific, US

Raman spectroscopy is highly sensitive to even slight changes in morphology of highly symmetrical, covalently bonded materials making it an ideal technique to characterize Silicon films. Furthermore, Raman spectroscopy is relatively insensitive to glass making [...]

Introduction to Raman Spectroscopy as a Characterization Tool for Carbon Nanotubes, Graphene, and other Carbon Nanostructures

Hodkiewicz J., Wall M., Thermo Fisher Scientific, US

While there have been many publications produced in which Raman spectroscopy has been used to characterize various aspects of carbon nanostructures, there have been few works published which provide an overview of what the technique [...]

Rapid Determination of Purity of Carbon Nanotubes

Hodkiewicz J., Wall M., Thermo Fisher Scientific, US

Raman spectroscopy can provide for quick measurements of the carbonaceous purity of carbon nanotube samples. Carbonaceous purity is a critical parameter for many applications of carbon nanotubes. Raman spectroscopy has been reported many times in [...]