Si-Based Process Aware SPICE Models for Statistical Circuit Analysis
Krishnamurthy S., Dasarapu V.K., Mahotin Y., Ryles R., Roger F., Uppal S., Mukherjee P., Cuthbertson A., Lin X-W, Synopsys, Inc., US
This paper describes methodology for constructing compact SPICE models as a function of process parameter variations. The methodology involves global extraction of process-dependant SPICE model parametersfrom silicon data. The robustness of this methodology was tested [...]