Cattani M. – TechConnect Briefs

Surface Roughness as a Function of the DLC Thickness Coating

Salvadori M.C., Martins D.R., Cattani M., University of Sao Paulo, BR

In this work we have analyzed the evolution of surfaces roughness coated with DLC. This study explores substrates with initial roughness (rms) between hundreds of nanometers and just few nanometers. We have used three substrates, [...]

Nanostructured Metallic Thin Films: Measurement of Critical Exponents

Melo L.L., Farias R.J.C., Salvadori M.C., Cattani M., University of Sao Paulo, BR

We have deposited metallic films (Au, Pt) on silicon substrates. The deposition technique was the Metal Plasma Immersion Ion Implantation and Deposition. Their roughnesses have been measured using a Scanning Tunneling Microscope. From these roughnesses, [...]

Young Modulus Measurement of Nanostructured Palladium Thin Films

Vaz A.R., Salvadori M.C., Cattani M., Institute of Physics of the University of Sao Paulo, BR

Young moduli (E2) of nanostructured metallic thin films are determined by measuring the resonance frequencies of AFM cantilevers. The cantilevers have been uniformly coated with metallic films. The E2 is determined using the vibrating beam [...]