Field Enhancement and Work Function Difference of IrO2 Nano-Emitter Arrays using EFM and SKPM Spectroscopy
Chiang D.C.-S., Lei P.Z.-F., Barrowcliff R., Zhang F., Washington State University and Sharp Corporation, US
We have measured two important physical properties related to field emission (surface potential and electric force gradient) of IrO2 nanorod emitter arrays using spectroscopy methods of electric force microscope (EFM) and scanning Kelvin probe microscope [...]