National Institute of Standards and Technology – Page 6

Responsive Hydrogels as Model Materials to Study the Deformation Behavior of Patterned Polymer Nanostructures

Tirumala V.R., Stafford C.M., Huang R., Lin E.K., Ocola L.E., National Institute of Standards and Technology, US

The mechanical stability of polymer nanolines is crucial to the success of semiconductor device fabrication. Recent experimental and modeling studies have focused on the influence of processing conditions on the stability of densely patterned lines. [...]

A unique opportunity for industrial scale fabrication of semiconductor nanowire-based devices

Nikoobkht B., National Institute of Standards and Technology, US

A method is developed which enables horizontal growth of semiconductor nanowires on predefined locations. In this architecture, despite most bottom-up approaches, there is no need for post-growth treatments and alignment of nanowires on a given [...]

A New High Precision Procedure for AFM Probe Spring Constant Measurement using a Microfabricated Calibrated Reference Cantilever Array (CRCA)

Reitsma M.G., Gates R.S., National Institute of Standards and Technology, US

A new technique for calibrating Atomic Force Microscope (AFM) cantilevers is demonstrated using a unique array of microfabricated reference cantilevers. The array, consisting of seven uniform rectangular cantilevers of different length (and thus stiffness), was [...]

New reference standards and artifacts for nanoscale property characterization

Pratt J.R., Kramar J.A., Shaw G., Gates R., Rice P., Moreland J., National Institute of Standards and Technology, US

This paper provides an overview of calibration artifacts being developed at NIST that will greatly aid the accurate determination of nanoscale physical properties across a broad range of applications. We focus on three proposed reference [...]

Multi-scale Discrete Dislocation Plasticity Analysis: Application to Nano-indentation

Khan S.M.A., Levine L.E., National Institute of Standards and Technology, US

With the growing utilization of nano-scale components in various technologies like MEMS, NEMS, thin films, medical diagnostics etc, nano-indentation testing is finding new expanding applications towards quantitative determination of mechanical properties at the nano-scale. In [...]

Quantum Dot Dissemination and Behavior in Bacterial Biofilms

Morrow J.B., Holbrook R.D., Zeissler C.J., National Institute of Standards and Technology, US

Quantum dots (QDs) are colloidal semiconductor nanocrystals that photoluminescence emission is proportional to the dot size and have been utilized in fluorescent imaging in biological systems. Biofilms are communities of microorganisms attached to surfaces encased [...]

Multivariant Measurements for Thin Film Adhesion as a Function of Temperature and Thin Film Thickness

Chiang M., Song R., Karim A., Amis E.J., National Institute of Standards and Technology, US

The progress of a proposed high-throughput combinatorial approach to the edge delamination test is reported. This approach can construct the adhesion reliability, as a function of temperature and film thickness (in the sub-micron range) in [...]