Tahoori M.B., Mitra S.
Northeastern University, US
Keywords: BIST, defect-tolerance, diagnosis, fault tolerance, molecular electronics, self-repair, test
Fault detection and diagnosis techniques that are essential for defect tolerance, fault tolerance and self-repair of molecular computing systems are discussed. These techniques enable robust molecular computing system design protected from manufacturing defects and run-time errors in the underlying hardware.
Journal: TechConnect Briefs
Volume: 3, Technical Proceedings of the 2004 NSTI Nanotechnology Conference and Trade Show, Volume 3
Published: March 7, 2004
Pages: 57 - 60
Industry sectors: Advanced Materials & Manufacturing | Sensors, MEMS, Electronics
Topic: Nanoelectronics
ISBN: 0-9728422-9-2