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HomeTopicsMaterials Characterization & Imaging

Topic: Materials Characterization & Imaging

The Casimir Force and quantum interaction between conducting macro-bodies at nanoscale distances

Petrov M., Petrov V., Petrov M., Petrov V., Bryksin V., Petter J., Tschudi T., Darmstadt Technical University, DE
We report for the first time on the optical detection of a periodical mechanical interaction between conducting macro-bodies induced by the periodical Casimir force. The influence of conductivity on the Casimir force has been analysed. [...]

Nano Equipment and Materials for Electronics – Market Needs and Outlook

Sheet L., SEMI, US
Nano equipment, tools and materials are critical to the further commercialization of nanoelectronics devices. The applications of various nano manufacturing methods and materials by nanoelectronics application are reviewed, followed by the status of critical nano [...]

Confocal Raman AFM, a powerful tool for the nondestructive characterization of heterogeneous materials

Schmidt U., Vargas F., Kress M., Dieing T., Weishaupt K., Hollricher O., WITec GmbH, DE
The Confocal Raman-AFM is a breakthrough in microscopy. It combines three measuring techniques in one instrument: a high resolution confocal optical microscope, an extremely sensitive Raman spectroscopy system, and an Atomic Force Microscope (AFM). Using [...]

Highly sensitive Scanning Capacitance Microscope

Tanbakuchi H., Agilent Technologies, US
Summary—Emerging nanotechnology and biotechnology are in direct need of metrology tools with better than 10 –nm spatial resolution that are capable of imaging surfaces and nanoembeded structures. Scanning local probe microscopy (SLPM) techniques have advanced [...]

An All-Digital Cantilever Controller for MRFM and Scanned Probe Microscopy using a Combined DSP/FPGA Design

de Roover D., Porter II L.M., Emami-Naeini A., Marohn J.A., Kuehn S., Garner S., Smith D.D., SC Solutions, Inc., US
An all-digital cantilever controller for magnetic resonance force microscopy (MRFM) was developed through a close collaboration between SC Solutions, Cornell University, and the U.S. Army Research Laboratory. The advantage of an all-digital controller is its [...]

Correlated roughness in polymer film containing magnetic nanoparticles

Abul Kashem M.M., Perlich J., Schulz L., Roth S.V., Müller-Buschbaum P., Technische Universität München, DE
We have investigated the roughness correlation between the substrate and this new type of nanocomposite film, prepared by using diblock copolymer poly(styrene-b-isoprene) as matrix and iron oxide nanoparticles covered with polystyrene hairs from a-lithium polystyrene [...]

Analysis of Interfacial Water Structure close to Mixed Langmuir Monolayers by Sum-Frequency Spectroscopy

Nickolov Z.S., Britt D.W., Miller J.D., Drexel University, Drexel Nanotechnology Institute, US
Sum frequency spectroscopy (SFS) in the OH stretching region was employed to obtain structural information about the interfacial water structure underneath Langmuir monolayers on H2O subphase. The films were composed by the model lipid dioctadecyldimethylammonium [...]

Near-Field Raman and Luminescence Spectroscopies to evidence chemical heterogeneity of surfaces with sub-wavelength spatial resolution

Humbert B., Grausem J., Dossot M., Cremel S., LCPME UMR 7564 CNRS-UHP, FR
Near-field scanning optical microscopy (NSOM or SNOM) offers the opportunity to collect optical information at a spatial scale well below the diffraction limit. Using a silica fiber tip coated with aluminum and having a small [...]

How to SPION Glass Transitions

Concha M., DeLong S., Radu L., Kumar C., Bidwell-Hanson P., University of New Orleans, US
The magnetic properties of superparamagnetic iron oxide nanoparticles (SPIONs) have made them useful tools in a variety of applications ranging from drug delivery to magnetorheologic valving in microfluidic systems. The structure of SPIONs is typically [...]

Analytical Methods for Nanotechnology

Mowat I.A., Moskito J., Ward I, Hartzell A., Evans Analytical Group, US
Growth in the fabrication of micro- and nano- engineered materials and systems has led to increased demand for analytical and characterization methods for these materials and systems. Many of the new manufacturing methods are extensions [...]

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