Accurate statistical simulation and modeling are important for IC design. Different types of statistical simulation require different types of statistical models. In this paper a unified approach to statistical modeling and characterization is presented. Based on physical process parameters and propagation of variance, it allows modeling of process extremes, distributional modeling for Monte Carlo type simulation, and modeling of mismatch.
Journal: TechConnect Briefs
Volume: 1, Technical Proceedings of the 2002 International Conference on Modeling and Simulation of Microsystems
Published: April 22, 2002
Pages: 715 - 718
Industry sector: Sensors, MEMS, Electronics
Topic: Compact Modeling