Ion exchange technique with photolithography-patterned metal mask is used to form silver nanoparticle patterns embedded in glass. Optical transmission measurement is performed to characterize the optical properties of silver nanoparticles. Atomic force microscopy (AFM) of an etched sample shows the pattern of the nanoparticles. Transmission electron microscope (TEM) with X-ray energy dispersive spectroscopy (EDS) and electron diffraction pattern are utilized to observe cross-sectional distribution and to confirm the existence of silver. The results indicate that the masked ion exchange process can provide the possibility of making patterned nanoparticle formations. These localized patterns of nanoparticles can be compatible with potassium-exchanged waveguides and microfluidic channels into an integrated chip for high-sensitivity surface enhanced spectroscopy.
Journal: TechConnect Briefs
Volume: 1, Nanotechnology 2009: Fabrication, Particles, Characterization, MEMS, Electronics and Photonics
Published: May 3, 2009
Pages: 183 - 186
Industry sector: Advanced Materials & Manufacturing
Topic: Nanoparticle Synthesis & Applications