In the design and simulation of micro/nano device areas, it becomes more and more important to obtain, fast and accurate, transient electric field solutions in combined conductor/dielectric materials. The time characteristics for such transient process vary depending on the electric properties of device. Normally, for conductor/dielectric combined device, the transient signal will last in the order of piso second. We have developed a fast, accurate algorithm, based on the conservation to total current, to simulate transient electric field in combined conductor/dielectric device. The numerical results based on our algorithm are match analytical ones at steady state very well. The detailed description and more results will be shown in formal paper.
Journal: TechConnect Briefs
Volume: 1, Technical Proceedings of the 2006 NSTI Nanotechnology Conference and Trade Show, Volume 1
Published: May 7, 2006
Pages: 701 - 704
Industry sector: Advanced Materials & Manufacturing
Topics: Informatics, Modeling & Simulation