Solving Electric Field in Combined Conductor and Dielectric Devices

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In the design and simulation of micro/nano device areas, it becomes more and more important to obtain, fast and accurate, transient electric field solutions in combined conductor/dielectric materials. The time characteristics for such transient process vary depending on the electric properties of device. Normally, for conductor/dielectric combined device, the transient signal will last in the order of piso second. We have developed a fast, accurate algorithm, based on the conservation to total current, to simulate transient electric field in combined conductor/dielectric device. The numerical results based on our algorithm are match analytical ones at steady state very well. The detailed description and more results will be shown in formal paper.

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Journal: TechConnect Briefs
Volume: 1, Technical Proceedings of the 2006 NSTI Nanotechnology Conference and Trade Show, Volume 1
Published: May 7, 2006
Pages: 701 - 704
Industry sector: Advanced Materials & Manufacturing
Topics: Informatics, Modeling & Simulation
ISBN: 0-9767985-6-5