Aloise G., Vitanov S., Palankovski V.
Advanced Material and Device Analysis Group, AT
Keywords: diode, Gunn, nitride, simulation
In this work, we assess the performance of InN Gunn diodes, as a superior alternative to GaN. We perform two-dimensional mixed-mode device/circuit simulation accounting for self-heating effects. We verify available theoretical results for GaN-based Gunn diodes. We use a proprietary hydrodynamic high-field mobility model, calibrated against Monte Carlo simulation data, which properly accounts for the NDM effects. Thus, a fundamental oscillation frequency of 70 GHz and an output power of 39 dBm is reached for a 3 um device, which is in agreement with previous results for the same setup. We study an InN Gunn diode with an active layer of 3 um length, connected to a LCR-Cavity, which we optimized. As a result, we obtain a fundamental oscillation frequency of 150 GHz.The corresponding calculated output power is 8 dBm. Although the predicted output power for the InN Gunn diode is lower than that expected for GaN devices, the former demonstrates a superior fundamental frequency due to the higher electron velocity. Compared to known GaAs devices, InN Gunn diode of the same size delivers roughly the same power at the fourfold frequency.
Journal: TechConnect Briefs
Volume: 2, Nanotechnology 2011: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational
Published: June 13, 2011
Pages: 599 - 602
Industry sector: Advanced Materials & Manufacturing
Topic: Informatics, Modeling & Simulation
ISBN: 978-1-4398-7139-3