Michel B., Hammacher J., Winkler T., Kaulfersch E.
Fraunhofer ENAS, DE
Keywords: EUCEMAN, micro reliability, nano reliability, research
Based on the conviction that advanced micro and nanotechnologies are continuing to have an ever stronger influence in all spheres of human life and will permeate them even more fully in the future, without, conversely, being accompanied by a strong increase in knowledge of issues concerning their reliability, an association has been constituted in Berlin, which carries the name “EUCEMAN – The European Center for Micro- and Nanoreliability”. In bringing together scientists, engineers and other experts and institutions, mainly from Europe, to collaborate on a voluntary, independent and non-profit basis, EUCEMAN endeavors to fill the following needs: •raise awareness about reliability issues on the micro-nano scale, •strengthen research and application of the addressed topic by integrating at international level the mass of issues, resources, and expertise •overcame fragmentation of research and enable synergism resulting from different but jointly applied approaches and tools •contribute to the organization and realization of the development of research strategies in Europe, especially the member states of the EU, •launch, promote and co-ordinate initiatives, proposals and important projects, •foster the dissemination and focused application of the latest research results and scientific findings concerning the high-technologies in the field. EUCEMAN makes it their aim to represent the leading edge in science and technology in their reliability field for the European region, empowered by the association’s members and their councils. Further, EUCEMAN acts as provider of reviews, evaluations, trend analyses, forecasts, recommendations and support, including funding.
Journal: TechConnect Briefs
Volume: 2, Nanotechnology 2010: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational
Published: June 21, 2010
Pages: 186 - 188
Industry sector: Sensors, MEMS, Electronics
Topic: Modeling & Simulation of Microsystems
ISBN: 978-1-4398-3402-2