Watts J., Lu N., Bittner C., Grundon S., Oppold J.
IBM, US
Keywords: circuit design, compact modeling, FET variation modeling, layout choices
In addition to the overall range of circuit characteristics expected from process variation the circuit designer needs to know how closely different circuit element will track one another. We describe a new methodology for modeling correlation between the chip mean variation different design FET and between different FET instances on a single chip. In addition it enables modeling the impact of circuit design choices on FET and circuit tracking.
Journal: TechConnect Briefs
Volume: Technical Proceedings of the 2005 Workshop on Compact Modeling
Published: May 8, 2005
Pages: 87 - 92
Industry sectors: Advanced Materials & Manufacturing | Sensors, MEMS, Electronics
Topic: Nanoparticle Synthesis & Applications
ISBN: 0-9767985-3-0