We describe a novel and unique imaging technique based on Compton scattering, a fundamentally different physical process than those based on photo-absorption techniques (such as XPS and its variants UPS/SRPS). This is unique since it yields information on electron cloud distribution of molecules on the interface at subnano resolution -a fraction of an angstrom or better. This resolution is unmatched by conventional imaging techniques available today, potentially enabling the study of interface structure of nanocomposite materials with unprecedented detail. The main objectives are twofold. First, to investigate a novel Compton Imaging Technique (CIT) with which the electronic structures of surface or interface molecules are mapped by the scattering of energetic photons. This will be accomplished by synchrotron radiation of the surface at high intensity and high resolution (0.1 Angstrom or less). This technique can yield information on charge density and chemical bonding that is not readily obtainable by conventional surface measurement techniques. Second, to develop a numerical model relating the charge density information to polymer surface micro-structure, surface energy and other important macroscopic surface/interface properties.
Journal: TechConnect Briefs
Volume: 3, Technical Proceedings of the 2003 Nanotechnology Conference and Trade Show, Volume 3
Published: February 23, 2003
Pages: 369 - 371
Industry sectors: Advanced Materials & Manufacturing | Sensors, MEMS, Electronics