Pavan P., Larcher L., Marmiroli A.
Università di Modena e Reggio Emilia, IT
Keywords: circuit design, compact model, floating gate, nonvolatile memory, reliability
This paper describes a possible approach to Compact Modeling of Floating Gate devices. Floating Gate devices are the basic building blocks of Semiconductor Nonvolatile Memories (EPROM, EEPROM, Flash). Among these, Flash are the most innovative and complex devices. The strategy followed developing this new model allows to cover a wide range of simulation conditions, making it very appealing for device physicists and circuit designers.
Journal: TechConnect Briefs
Volume: 2, Technical Proceedings of the 2004 NSTI Nanotechnology Conference and Trade Show, Volume 2
Published: March 7, 2004
Pages: 120 - 123
Industry sector: Sensors, MEMS, Electronics
Topic: Compact Modeling
ISBN: 0-9728422-8-4