Notsu T., Miura K., Nakamae K.
Osaka University, JP
Keywords: defect-tolerance, PLA, QCA, simulation
In this study we analyze the precedent AND/OR plane cell of a programmable logic array (PLA) based on the quantum-dot cellular automata (QCA), then propose a modified layout that has better defect tolerance. We analyzed which QCA device (quantum-dot cell) limits the defect tolerance of the precedent AND/OR plane cell by a simulator. It was found that the crossing-point of a wire and an inverter-chain causes degradation of the defect tolerance. We propose a new layout of the AND/OR plane cell that improves the defect tolerance of QCA-based PLA. The defect tolerance of the QCA-based PLA with the precedent AND/OR plane cells and that with the proposed cells are evaluated by a simulator. The results show that our PLA have better defect tolerance.
Journal: TechConnect Briefs
Volume: 2, Nanotechnology 2010: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational
Published: June 21, 2010
Pages: 29 - 32
Industry sector: Sensors, MEMS, Electronics
Topic: Nanoelectronics
ISBN: 978-1-4398-3402-2