Counting and Controlling Point Defects in Carbon Nanotube Electronic Circuits

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As with any disruptive technology in its early stages, nanoelectronics faces major scientific and technological challenges. As initial investigations of carbon nanotube circuits mature, attention can be turned to issues of reliability and reproducibility. This presentation will focus on two recent developments improving carbon nanotube materials for electronics. First, we have developed a wafer-level, electrochemical process which can be used to quantify the defect density of large-area carbon nanotube circuit arrays. Being able to assess and control defects is critical for better process control and device reproducibility. We will demonstrate the role which point defects play in both transistor-like behaviors as well as chemical sensor responses. Second, we will address the related topic of noise in nanotube circuits, and demonstrate noise mechanisms which, when controlled, can reduce circuit fluctuations by two orders of magnitude.

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Journal: TechConnect Briefs
Volume: 2, Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 2
Published: May 8, 2005
Pages: 230 - 233
Industry sector: Advanced Materials & Manufacturing
Topics: Carbon Nano Structures & Devices
ISBN: 0-9767985-1-4