Characterization of Aluminum Nitride Nanostructures by XANES and FTIR Spectroscopies with Synchrotron Radiation

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We investigated nano-systems of AlN synthesized by DC arc-plasma-induced melting of aluminum in a nitrogen–argon ambient. Actually, the reaction of molten Al with N2 gas yields on a water-cooled surface a mixture of both nanowires and nanoparticles.
Experiments were performed at the Synchrotron Radiation facility of the INFN – Laboratori Nazionali di Frascati on AlN nano-systems using both Fourier Transform Infrared Spectroscopy (FTIR) and X-ray Absorption Near Edge Spectroscopy (XANES) in order to characterize these materials with both interesting tribological and electronic properties.
Comparison will be made between the information available from Infrared spectra, that probes the optical phonon modes mainly concerned with the molecular structure and the bonding energies of such nano-systems, and that available from X-ray absorption at the K-edge of Al that is connected to the local and empty density of states of this high-gap insulator. Comparison of the different local atomic structures around the Al site in AlN nanoparticles and nanotubes will be also discussed.

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Journal: TechConnect Briefs
Volume: 1, Technical Proceedings of the 2006 NSTI Nanotechnology Conference and Trade Show, Volume 1
Published: May 7, 2006
Pages: 233 - 238
Industry sector: Advanced Materials & Manufacturing
Topics: Advanced Materials for Engineering Applications, Coatings, Surfaces & Membranes
ISBN: 0-9767985-6-5