Lyshevski S.E., Shmerko V., Yanushkevich S.
Rochester Institute of Technology, US
Keywords: electronics, performance, processing platforms
We study physical limits and research performance estimates. The designer examines the device and system performance and capabilities using distinct performance measures, estimates, indexes and metrics. At the device level, we examine functionality, study characteristics and estimate performance of 3D-topology Mdevices.
Journal: TechConnect Briefs
Volume: 3, Nanotechnology 2008: Microsystems, Photonics, Sensors, Fluidics, Modeling, and Simulation – Technical Proceedings of the 2008 NSTI Nanotechnology Conference and Trade Show, Volume 3
Published: June 1, 2008
Pages: 31 - 34
Industry sectors: Advanced Materials & Manufacturing | Sensors, MEMS, Electronics
Topic: Photonic Materials & Devices
ISBN: 978-1-4200-8505-1