Vasiliou J.
Duke Scientific Corporation, US
Keywords: DMA, measurement, NIST, particle, size, SMPS, standards
A scanning mobility particle sizer (TSI Model 3936) was evaluated using Duke Scientific NIST traceable particle size standards as well as NIST SRM’s. The importance of instrument setup, electrospray operation and sample preparation for polystyrene spheres are discussed as well as the results from 14 different size reference standards. Correlation between the SMPS system, electron microscopy, and dynamic light scatting methods are also shown. Results show that with proper operation, the SMPS results fall within the uncertainty of the NIST traceable sizes in the range that was evaluated — 20 to 100 nm.
Journal: TechConnect Briefs
Volume: 2, Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 2
Published: May 8, 2005
Pages: 691 - 694
Industry sector: Advanced Materials & Manufacturing
Topic: Materials Characterization & Imaging
ISBN: 0-9767985-1-4