Accommodation of Characterization Tools: Understanding the Building Vibration, Stray Electromagnetic Fields and Acoustic Interference to Avoid Catastrophic Inferences in New Building Construction or Building Renovations

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Characterization tools are the cornerstone to nanoscale research including microscopy (TEM, SEM, AFM and Aberration Corrected Electron Microscopy), spectroscopy/spectrometry (NMR, FTIR, Acoustic), and advanced nano mechanical (nano scale manipulations) tools. Characterization tools are highly sensitive and require that the installation environment be free of electromagnetic fields, vibration and noise. A recent high profile, new construction University Center found that a third of their labs may be unusable for the intended research tools because of problems with excessive building vibration, electromagnetic fields, and acoustic interference. AGI will share how a construction or renovation project planning process, utilized in several recent Nanofabrication buildings, can help identify tool requirements, convert these to construction requirements and will review options to mitigate potential catastrophic interferences. AGI will review particular challenges of placing advanced instrumentation facilities in urban settings, including impact of light rail, roadway, and airplane traffic. AGI will use real world examples from recent metrology center designs at Duke University Fitzgerald Center for Interdisciplinary Engineering and Medial Applied Sciences (Characterization Labs), Harvard University Laboratory for Interface Science and Engineering (Imaging/Metrology Center), Arizona State University (Biodesign Institute labs and Light Rail) and University of Arizona (existing tool set and a future Modern Street Car) to highlight the challenges and best methods of accommodating characterization tools in state-of-the-art facilities.

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Journal: TechConnect Briefs
Volume: 1, Nanotechnology 2009: Fabrication, Particles, Characterization, MEMS, Electronics and Photonics
Published: May 3, 2009
Pages: 425 - 428
Industry sector: Advanced Materials & Manufacturing
Topic: Materials Characterization & Imaging
ISBN: 978-1-4398-1782-7