This paper presents a characterized nodel for an ultrafast-recovery (UFR) rectifier based on the manufacturing processes and device structural geometry. The accuray of the developed model depends upon the proper selection of physical models and model parameters, especially carrier lifetime, which is a key parameter to the device characteristics Different models and model parameters of the numerical device simulator are studied to realize a unique set of models that can accurately predict both static and dynamic characteristics of the rectifier. The developed model is verified through experimental data.
Journal: TechConnect Briefs
Volume: Technical Proceedings of the 1998 International Conference on Modeling and Simulation of Microsystems
Published: April 6, 1998
Pages: 431 - 436
Industry sector: Sensors, MEMS, Electronics